The R74 Thermal Imaging test chart, with improve dual material construction, provides a clear optical path USAF resolution pattern. Suitable for resolution testing of Thermal, Far IR, UV and X-ray systems.
The front blackened 100mm square copper card supports a finely patterned nickel central foil. The open apertures provide a clear air path pattern, to eliminate chromatic and absorption issues experienced with other solid substrate formats.
Model | Description | Pattern |
R74 | USAF Thermal Imaging Resolution Test Chart, Negative Image, Group -2 Element 1 to Group 4 Element 6. |
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010-82895362
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Email：imaging@scientificimaging.cn
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